Optical Vector Analysis and Optical Link Diagnosis System OCI-V/OLI/OCI
High-precision optical measurement device series for silicon photonics and optical devices!
The "OCI-V/OLI/OCI" is a high-precision optical measurement system that comprehensively covers everything from measuring insertion loss, dispersion, and polarization characteristics to pinpointing the location of minute defects. We offer the optical vector analysis system "OCI-V," which analyzes the properties of light from multiple angles, as well as "OLI" and "OCI," which diagnose faults with high precision. We support everything from research and development to manufacturing inspection with speed and high accuracy. 【Main Features of OCI】 ■ High-precision measurement using OFDR technology ■ Event point location identification accuracy: up to 0.1mm ■ Wavelength range: 1525–1625nm or 1265–1340nm ■ Self-calibration function ■ High measurement stability *For more details, please download the PDF or feel free to contact us.
- Company：日本レーザー
- Price：Other
